[1]杨志强,冯全源.使用动态元件匹配技术的带隙基准源的设计[J].应用科技,2019,46(05):34-38.[doi:10.11991/yykj.201811010]
 YANG Zhiqiang,FENG Quanyuan.Design of a bandgap reference source with dynamic elements matching[J].Applied science and technology,2019,46(05):34-38.[doi:10.11991/yykj.201811010]
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使用动态元件匹配技术的带隙基准源的设计(/HTML)
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《应用科技》[ISSN:1009-671X/CN:23-1191/U]

卷:
第46卷
期数:
2019年05期
页码:
34-38
栏目:
现代电子技术
出版日期:
2019-09-05

文章信息/Info

Title:
Design of a bandgap reference source with dynamic elements matching
作者:
杨志强 冯全源
西南交通大学 微电子研究所, 成都 611756
Author(s):
YANG Zhiqiang FENG Quanyuan
Institute of Microelectronics, Southwest Jiaotong University, Chengdu 611756, China
关键词:
基准电压源精度恶化稳定性高增益运算放大器差分电路器件失配动态元件匹配
Keywords:
band-gap reference sourcedeterioration of accuracystabilityhigh gainoperational amplifierdifferential circuitelements mismatchingdynamic elements matching
分类号:
TN402
DOI:
10.11991/yykj.201811010
文献标志码:
A
摘要:
为了改善器件失配引起的误差对带隙基准精度及稳定性的影响,设计了一款基于BICMOS 0.15 μm工艺的带隙基准电压源。电路使用传统的带隙基准结构,为了提高增益,采用两级放大器;为了解决器件失配造成的不稳定性,采用了动态元件匹配技术。经过spectre仿真表明:此基准源能够很好地改善器件失配带来的误差,从而保证基准源的精度以及稳定性,5.0 V供电、温度在233 K(-40 ℃)~378 K(105 ℃)变化时,相比于没有使用动态元件匹配的电路,该电路最少能够减小68%的误差;典型温度298 K(25 ℃)、电压在4.5~5.5 V变化时,相比于没有使用动态元件匹配的电路,该电路最少能够减小70%的误差。仿真结果显示,电路具有高稳定性。
Abstract:
To improve the accuracy and stability problem of bandgap reference source caused by elements mismatching error, a bandgap reference source based on BICMOS 0.15μm BCD process was designed. The circuit is based on traditional bandgap reference structure with a two-stage amplifier for increasing gain. The technology of dynamic elements matching (DEM) was used to solve the elements mismatching problem. Spectre simulation results show that this reference circuit can solve the elements mismatching problem perfectly, ensuring the accuracy and stability of reference source. Under the power voltage of 5.0 V, with the temperature ranging from 233 K (-40℃) to 378 K (105℃), this circuit can reduce 68% of the error at least by comparison with the circuit without DEM; Under the temperature of 298 K (25℃), with the power voltage ranging from 4.5 V to 5.5 V, this circuit can reduce 70% of the error at least by comparison with the circuit without DEM. It can be concluded that this circuit is of high stability.

参考文献/References:

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备注/Memo

备注/Memo:
收稿日期:2018-06-25。
基金项目:国家自然科学基金重点项目(61531016);四川省科技支撑计划重点项目(2016GZ0059,2017GZ0110)
作者简介:杨志强,男,硕士研究生;冯全源,男,教授,博士
通讯作者:冯全源,E-mail:fengquanyuan@163.com
更新日期/Last Update: 2019-08-29